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HQ072727SZL01ActiveRFI

Non-Volatile Memory Susceptibility Prediction

Department of DefenseDEFENSE MICROELECTRONICS ACTIVITY

AI Overview

DMEA seeks test development to predict susceptibility of embedded fuse/anti-fuse non-volatile memory arrays to inadvertent bit cell transitions from programming stress. This addresses microelectronics reliability for defense applications.

This summary is AI-generated from the official solicitation.

Key Details

Agency
Department of Defense
Funding Amount
—
Release Date
October 1, 2026
Due Date
October 15, 2026

Official Description

--- Attachment text --- [Sources_Sought_DMEA_SOW_26_6G9_NVM.pdf] Number: HQ072727SZL01

Notice Type: Sources Sought

Synopsis:
The Defense Microelectronics Activity (DMEA), McClellan, CA is issuing this Sources Sought Notice to find potential sources to provide Non-Volatile Memory Susceptibility Prediction. Moreover, DMEA requires test development that will predict the susceptibility of an embedded fuse- or anti-fuse Non- Volatile Memory (NVM) array architecture to inadvertent bit cell ...

View on official source

Change History

Opportunity AddedOct 1, 2026 at 6:40 PM

Non-Volatile Memory Susceptibility Prediction

New opportunity: Non-Volatile Memory Susceptibility Prediction

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